BIST diagnostics, Part 1: Simulation models
Document Type
Conference Proceeding
Publication Date
12-1-1998
Abstract
An efficient method is described for using fault simulation as a solution to the diagnostic problem created by the presence of embedded memories in BIST designs. The idea is to create simulation models that only use the combinational logic (i.e., the memory is removed).
Identifier
0032305515 (Scopus)
Publication Title
Proceedings of the Asian Test Symposium
ISSN
10817735
First Page
8
Last Page
14
Recommended Citation
Savir, Jacob, "BIST diagnostics, Part 1: Simulation models" (1998). Faculty Publications. 16201.
https://digitalcommons.njit.edu/fac_pubs/16201
COinS
