Photorefractive beam-coupling measurement of the nonlinear refractive index of semiconductor films

Document Type

Article

Publication Date

1-1-2000

Abstract

The nonlinear refractive index n2 of short lengths (<25 m) of a 20 m silica fiber were measured by photorefractive beam-coupling of 53 ps, 1064 nm pulses that experienced self-phase modulation (SPM) in the fiber. The resultant Induced Grating Autocorrelation (IGA) response yields a value of n2 and a calibration standard for the fiber. By coupling the 1064 nm signal pulse into a semiconductor film and taking the output and coupling it into the calibrated fiber, the modified IGA response, with respect to the fiber alone, results in both the sign and the magnitude of n2 of the semiconductor film. The sign and magnitude of n2 for 1 mm thick GaAs, ZnTe, and CdTe films have been measured by noting the modified IGA response - the temporal shift of the photorefractive beam-coupling response due to SPM in the semiconductor.

Identifier

85212477936 (Scopus)

Publication Title

Physica Status Solidi B Basic Research

External Full Text Location

https://doi.org/10.1002/1521-3951(200007)220:1<47::aid-pssb47>3.3.co;2-l

ISSN

03701972

First Page

47

Last Page

51

Issue

1

Volume

220

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