Algorithm-based fault detection of analog linear time-invariant circuits

Document Type

Conference Proceeding

Publication Date

1-1-2001

Abstract

Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology.

Identifier

0034822501 (Scopus)

Publication Title

Conference Record IEEE Instrumentation and Measurement Technology Conference

First Page

49

Last Page

54

Volume

1

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