Coefficient-based parametric faults detection in analog circuits

Document Type

Conference Proceeding

Publication Date

1-1-2003

Abstract

Coefficient-based method is introduced for the parametric faults detection in analog circuits. By use of pseudo Monte-Carlo simulation we can greatly speed up the calculation of bounds of CUT transfer function's coefficients. We can estimate transfer function's actual numeric coefficients with system identification method. There is no need for a apriori knowledge of the symbolic transfer function. Finally we show that it is possible to determine whether any given CUT is faulty.

Identifier

0037699671 (Scopus)

Publication Title

Proceedings of the IEEE Great Lakes Symposium on VLSI

External Full Text Location

https://doi.org/10.1145/764883.764886

ISSN

10661395

First Page

299

Last Page

302

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