Analog Circuit Test using Transfer Function Coefficient Estimates

Document Type

Conference Proceeding

Publication Date

11-6-2003

Abstract

An account of the analog circuit testing method based on estimating the transfer function coefficients was presented. The coefficient-based test (CBT) method was employed for detecting parametric fault in analog circuits. The method used Monte-Carlo simulation and system identification tools for determining the faults in a given circuit under test (CUT).

Identifier

0142215921 (Scopus)

Publication Title

IEEE International Test Conference TC

ISSN

10893539

First Page

1155

Last Page

1163

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