Date of Award
Doctor of Philosophy in Electrical Engineering - (Ph.D.)
Electrical and Computer Engineering
Hieu Pham Trung Nguyen
The systematically growing power (heat) dissipation in CMOS transistors with each successive technology node is reaching levels which could impact its reliable operation. The emergence of technologies such as bulk/SOI FinFETs has dramatically confined
Paliwoda, Peter Christopher, "Characterization of self-heating effects and assessment of its impact on reliability in finfet technology" (2018). Dissertations. 1389.